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  • 标题:Producción tecnológica latinoamericana con mayor visibilidad internacional: 1996-2007. Un estudio de caso: Brasil
  • 本地全文:下载
  • 作者:Maidelyn Díaz Pérez ; Soleidy Rivero Amador ; Félix de Moya-Anegón
  • 期刊名称:Revista española de Documentación Científica
  • 印刷版ISSN:1988-4621
  • 出版年度:2010
  • 卷号:33
  • 期号:1
  • 页码:34-62
  • DOI:10.3989/redc.2010.1.708
  • 语种:Spanish
  • 出版社:Consejo Superior de Investigaciones Científicas
  • 摘要:This work proposes a set of indicators based on patent documents that allow researchers to represent and analyse the behaviour of technological production within a particular domain. This proposal is here validated via a case study. Collected data were processed employing an in-house tool designed for use in patentometric studies. Latin American technological knowledge published in the USA between September 1996 and April 1997 was examined, paying special attention to that of Brazil, the largest Latin American filer of patents. The set of patentometric indicators proposed allows one to quantify and qualify the behaviour of technological production in terms of the patents granted. Using the patents analysed, the technological capacity revealed in the different technical areas covered is represented, along with the ranking of institutes, research centres and industries, etc. The productivity of their principal technologists and their relationships is also shown. The latter element of analysis favours cooperation and technological exchange, as well as the identification of priorities and opportunities. The above information is an aid for the planning, implementation and assessment of research and technological development policies at any level. This kind of analysis is considered an indispensable tool for improving our knowledge of regional technological resources. It also encourages the better use of existing technological capacities.
  • 关键词:Patentometric indicators;patents;patent information;analysis systems;Latin American technological production;Brazilian patents;Indicadores patentométricos;patentes;sistemas de análisis de información de patentes;producción tecnológica de América Latina;patentes de Brasil
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