摘要:The preliminary results of microstructural characterization and creep behaviour of an innovative TiAl 8% atomic Nb alloy are exposed in this paper. Two different batches of this material, with same nominal chemical composition, but produced through different solidification processes and heat treatments, have been studied. The production processes generated different ? + ?2 microstructures in the two batches, both analyzed through X ray diffractometry (XRD) and transmission electron microscopy (TEM). Constant load creep tests have been performed on both batches at the same temperatures (700?C and 850?C) and loads in order to compare the creep behaviours. XRD and TEM analyses have been carried out after creep tests in order to determine microstructural evolution of the materials and to establish correlation with creep behaviours.