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  • 标题:On-the-fly Diagnosability Analysis of Labeled Petri Nets Using Minimal Explanations
  • 本地全文:下载
  • 作者:Ben Li ; Baisi Liu ; Armand Toguyeńi
  • 期刊名称:IFAC PapersOnLine
  • 印刷版ISSN:2405-8963
  • 出版年度:2015
  • 卷号:48
  • 期号:21
  • 页码:326-331
  • DOI:10.1016/j.ifacol.2015.09.548
  • 语种:English
  • 出版社:Elsevier
  • 摘要:In this paper, an approach is developed for diagnosability analysis of discrete event systems (DESs) modeled by labeled Petri nets (LPNs). Our approach, which extends from the on-the-fly and incremental diagnosis technique, aims at improving the efficiency of diagnosability analysis by generating as less state space as possible. Thanks to the minimal explanation notion, our improved approach holds the existing advantages of on-the-fly technique, while generating less fault markings (FMs). In particular, when the system has many unobservable transitions/events, our approach can be more efficient with lower memory cost for diagnosability analysis.
  • 关键词:Fault diagnosisDiscrete event systemLabeled Petri netDiagnosability analysisOn-the-fly analysisMinimal explanation
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