期刊名称：Signal & Image Processing : An International Journal (SIPIJ)
印刷版ISSN：2229-3922
电子版ISSN：0976-710X
出版年度：2011
卷号：2
期号：3
页码：121
出版社：Academy & Industry Research Collaboration Center (AIRCC)
摘要：Smaller feature size, higher clock frequency and lower power consumption are of core concerns of today’snano-technology, which has been resulted by continuous downscaling of CMOS technologies. The resultant‘device shrinking’ reduces the soft error tolerance of the VLSI circuits, as very little energy is needed tochange their states. Safety critical systems are very sensitive to soft errors. A bit flip due to soft error canchange the value of critical variable and consequently the system control flow can completely be changedwhich leads to system failure. To minimize soft error risks, a novel methodology is proposed to detect andrecover from soft errors considering only ‘critical code blocks’ and ‘critical variables’ rather thanconsidering all variables and/or blocks in the whole program. The proposed method shortens space andtime overhead in comparison to existing dominant approaches.
