期刊名称：Signal & Image Processing : An International Journal (SIPIJ)
印刷版ISSN：2229-3922
电子版ISSN：0976-710X
出版年度：2014
卷号：5
期号：6
页码：17
出版社：Academy & Industry Research Collaboration Center (AIRCC)
摘要：This paper presents a novel method to recognize stem - calyx of an apple using shape descriptors. The maindrawback of existing apple grading techniques is that stem - calyx part of an apple is treated as defects,this leads to poor grading of apples. In order to overcome this drawback, we proposed an approach torecognize stem-calyx and differentiated from true defects based on shape features. Our method comprisesof steps such as segmentation of apple using grow-cut method, candidate objects such as stem-calyx andsmall defects are detected using multi-threshold segmentation. The shape features are extracted fromdetected objects using Multifractal, Fourier and Radon descriptor and finally stem-calyx regions arerecognized and differentiated from true defects using SVM classifier. The proposed algorithm is evaluatedusing experiments conducted on apple image dataset and results exhibit considerable improvement inrecognition of stem-calyx region compared to other techniques.
