摘要：The research explains the development of Readiness Level measurement. The initial concept of Readiness Level is Technology Readiness Level (TRL). TRL is an important metric used by U.S. government agencies such as NASA and the Department of Defense and is designed to quantify the maturity of a new technology and to enable comparisons with alternatives. System technology assessment evolves with the presence of Integration Readiness Level (IRL) and System Readiness Level (SRL). A quantitative combination of levels of readiness can be made and open the potential for expanding the other sizes of readiness levels, such as the Manufacturing Readiness Level (MRL). A measurement tool to measure the development of readiness level by involving MRL is called System Readiness Level Plus (SRL+). This research focuses on quantitative analysis of SRL+model. It consists of the mathematical properties method and readiness reversal method. Several steps can be conducted to design the SRL+model. This model was developed from the System Readiness Level metric by Ross, combined with Incidence Matrix Approach by London. The first step is developing the function of the SRL+model. The second step is conducting computation using a development model that is SRL+. The third step is carrying out validity of SRL+model. The result indicates that SRL+model can be mathematically proven.
