摘要：AbstractThe assessment of the students in KKKL3054 Microelectronic includes PBL (20%), quizzes (10%), midterm exam (20%), tutorial (10%), and final exam (40%). In this paper, we discuss the performance of the students’ achievement in the final examination. By using the Rasch model, the students’ performance based on the difficulty level of each question, can be assessed. Each question is mapped to the number of students who are able to answer the question correctly. Results from the 17 students assessed, answering 15 questions of the final examination, showed that the distribution of the ability of each student answering questions from different levels of difficulty are fairly distributed. Findings from this evaluation can help us improve the course content as well as the course outcomes. We can conclude that by using the Rasch model, the ability of each student answering the final exam questions can be evaluated.
关键词：Microelectronic students (KKKL3054);Student's achievement;Rasch Model;Question from different difficulty level
