摘要：AbstractOne of the main issues in railway traction applications is the control of critical electronic components reliability. Insulated Gate Bipolar Transistors (IGBT) modules are part of these components. In their operating environment, they are subjected to high stresses due to severe conditions of use of the train. The increase of requirements in terms of reliability and safety impose to be able to assess these dependability measures. This paper introduces a methodological framework for predicting reliability of IGBT based on an innovative and structured Bayesian approach. An application study with real data has been finally carried out.
关键词：KeywordsReliability predictionBayesian NetworksIGBT power modulesRailway traction applications
