出版社：University of Malaya * Faculty of Computer Science and Information Technology
摘要：This paper introduces a new class of assignment decision diagrams (ADD) called thrutestable ADDs based on a testability property called thru function. The thrutestable ADDs is an easilytestable set of thru functions that allows data transfer from its input to its output. We also define a designfortestability (DFT) method to augment a given ADD with thru functions so that the ADD becomes thrutestable. We compare the circuits modified using our proposed method with the original circuits and partial scan designed circuits in terms of fault efficiency, area overhead, test generation time and test application time. Since the proposed DFT method is introduced at a high level, which deals with less number of gates, the information of thru functions can be extracted more easily. As a result, it lowers the area overhead compared to partial scan.
关键词：Assignment Decision Diagram (ADD); Thrutestable; DesignForTestability (DFT); Digital testing
