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  • 标题:Free-electron laser data for multiple-particle fluctuation scattering analysis
  • 本地全文:下载
  • 作者:Kanupriya Pande ; Jeffrey J. Donatelli ; Erik Malmerberg
  • 期刊名称:Scientific Data
  • 电子版ISSN:2052-4463
  • 出版年度:2018
  • 卷号:5
  • DOI:10.1038/sdata.2018.201
  • 语种:English
  • 出版社:Nature Publishing Group
  • 摘要:Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100鈥?00 multi-particle diffraction patterns originating from approximately 50 to 200 Paramecium Bursaria Chlorella virus particles per snapshot. In addition to the raw data, a selection of high-quality pre-processed diffraction patterns and a reference SAXS profile are provided.
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