摘要：An objective Bayesian inference is proposed for the generalized marginal random effects model p(x|μ,σλ)=f((x−μ1)T(V+σλ2I)−1(x−μ1))/det(V+σλ2I). The matrix V is assumed to be known, and the goal is to infer μ given the observations x=(x1,…,xn)T, while σλ is a nuisance parameter. In metrology this model has been applied for the adjustment of inconsistent data x1,…,xn, where the matrix V contains the uncertainties quoted for x1,…,xn.
