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  • 标题:Adaptive semiparametric wavelet estimator and goodness-of-fit test for long-memory linear processes
  • 本地全文:下载
  • 作者:Jean-Marc Bardet ; Hatem Bibi
  • 期刊名称:Electronic Journal of Statistics
  • 印刷版ISSN:1935-7524
  • 出版年度:2012
  • 卷号:6
  • 页码:2383-2419
  • DOI:10.1214/12-EJS754
  • 语种:English
  • 出版社:Institute of Mathematical Statistics
  • 摘要:This paper is first devoted to the study of an adaptive wavelet-based estimator of the long-memory parameter for linear processes in a general semiparametric frame. As such this is an extension of the previous contribution of Bardet et al. (2008) which only concerned Gaussian processes. Moreover, the definition of the long-memory parameter estimator has been modified and the asymptotic results are improved even in the Gaussian case. Finally an adaptive goodness-of-fit test is also built and easy to be employed: it is a chi-square type test. Simulations confirm the interesting properties of consistency and robustness of the adaptive estimator and test.
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