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  • 标题:Data-driven Key Performance Indicator Fault Detection Approach Based on Sparse Direct Orthogonalization
  • 本地全文:下载
  • 作者:Hao Zhou ; Hao Ye ; Shen Yin
  • 期刊名称:IFAC PapersOnLine
  • 印刷版ISSN:2405-8963
  • 出版年度:2020
  • 卷号:53
  • 期号:2
  • 页码:11620-11625
  • DOI:10.1016/j.ifacol.2020.12.643
  • 语种:English
  • 出版社:Elsevier
  • 摘要:AbstractIn recent years, key performance indicator (KPI) detection has attracted much attention in large-scale process plants. Several methods have been developed to solve this issue. However, further studies find that post-processing methods have relatively high false alarm rates (FARs) for quality-unrelated faults. Also, methods combined with preprocessing, like orthogonal signal correction-modified partial least squares (OSC-MPLS), sometimes lack robustness. To deal with this problem, this paper proposes an enhanced pretreatment method, namely sparse direct orthogonalization (SDO), and a novel KPI-related fault detection approach called SDO-MPLS is developed. Compared with OSC-MPLS, the proposed approach has more robust performance and better interpretability, while a numerical case and the Tennessee Eastman process (TEP) are used to demonstrate the effectiveness of the proposed approach.
  • 关键词:KeywordsKey performance indicatorsProcess monitoringSparse direct orthogonalizationModified partial least squaresFault detection
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