摘要：AbstractThis article presents the new formalism called V-nets as a tool to deal with diagnosis problems of Cyber-Physical Systems (CPS) and industrial processes, situations such as simultaneity of events, partial recognition of event sequences, and false positives. Cyber-Physical Systems (CPS) and industrial processes demand the reliability of its supervisory and control elements, especially in fault detection applications. There are many scenarios in which typical formal models of DES (Discrete Event Systems) do not guarantee by itself a reliable analysis of the circumstances. The simultaneous occurrence of discrete events and false positives are circumstances examined in this paper and the new formalism V-nets is presented as a new tool that can manage the situations described.
