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  • 标题:Comparison of Some Exact Tests for a Common Location Parameter of Several Truncated Exponential Distributions with Different Scale Parameters
  • 本地全文:下载
  • 作者:Yehenew G. Kifle ; Bimal K. Sinha
  • 期刊名称:Sankhya. Series B, applied and interdisciplinary statistics
  • 印刷版ISSN:0976-8386
  • 电子版ISSN:0976-8394
  • 出版年度:2021
  • 卷号:83
  • 页码:36-64
  • DOI:10.1007/s13571-021-00254-1
  • 语种:English
  • 出版社:Indian Statistical Institute
  • 摘要:In this paper we derive some exact tests and one conservative test for a common location parameterμof several independent truncated exponential distributions with different scale parameters. Tests forμ=μ0against two-sided alternatives are suggested based on suitable combinations of natural pivots. The exact tests are based on non-minimal sufficient statistics while the conservative test is based on minimal sufficient statistics. Expressions for local power for alternativesμ>μ0are derived and compared. It turns out that the power for alternativesμμ0is the same for all proposed exact tests. We observe that the test based on a combination of inverse normal cdf ofP-values is locally best in most cases. The performance of the conservative test is indeed remarkable in large samples. Some interesting features of a familiar test in the case of one population are also pointed out.
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