首页    期刊浏览 2025年05月29日 星期四
登录注册

文章基本信息

  • 标题:Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band
  • 本地全文:下载
  • 作者:Thanh-Luan Vu ; Stéphane Barlerin ; Yves Stricot
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2021
  • 卷号:11
  • DOI:10.1038/s41598-021-00187-9
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:Mm-wave dielectric waveguides are a promising and low-cost technology for the transmission of ultra-high data rates. Besides the attenuation (losses) and group delay, the bending loss of the dielectric waveguides is also one of the key parameters to establish the capacity and energy efficiency of such wired links, when deployed in realistic scenarios. In this context, we report the experimental characterizations of bending effects for various solid and hollow commercially available dielectric waveguides at V-band (50–75 GHz). A wide-band transition has been designed to carry out the measurements using a Vector Network Analyzer (VNA) and extension modules. The measured results are in very good agreement with full-wave simulations. Our experimental results show an average bending loss of 1.46 dB over the entire V-band for the fundamental \documentclass[12pt
国家哲学社会科学文献中心版权所有