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  • 标题:Fractal grid-induced turbulence strength characterization via piezoelectric thin-film flapping velocimetry
  • 本地全文:下载
  • 作者:Ted Sian Lee ; Ean Hin Ooi ; Wei Sea Chang
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2021
  • 卷号:11
  • DOI:10.1038/s41598-021-02680-7
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:The centerline streamwise and cross-sectional ( x/ D h  = 0.425) turbulence characteristics of a 2D planar space-filling square-fractal-grid (SFG) composed of self-similar patterns superimposed at multiple length-scales is experimentally unveiled via piezoelectric thin-film flapping velocimetry (PTFV). The fluid–structure-interaction between a flexible piezoelectric thin-film and SFG-generated turbulent flow at Re Dh  = 4.1 × 10 4 is investigated by analysis of the thin-film’s mechanical response. Measurements of the thin-film-tip deflection δ and induced voltage V demonstrate increasing flow fluctuation strength in the turbulence generation region, followed by rapid decay further downstream of the SFG. Interestingly, SFG-induced turbulence enables the generation of maximum centerline thin-film’s response ( V rms , δ rms ) and millinewton turbulence-forcing (turbulence-induced excitation force acting on the thin-film) F rms which are respectively, 7× and 2× larger than the classical square-regular-grid of similar blockage ratio. The low frequency, large-scale energy-containing eddies at SFG’s central opening plays a critical role in driving the thin-film vibration. Most importantly, the SFG-generated turbulence at ( y/ T  = 0.106, z/ T  = 0.125) away from the centerline allows equivalent mechanical characteristics of turbulence generation and decay, with peak of 1.9× nearer from grid. In short, PTFV provides a unique expression of the SFG-generated turbulence, of which, the equivalent turbulence length-scale and induced-forcing deduced could aid in deciphering the flow dynamics for effective turbulence management.
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