期刊名称：American Journal of Electrical and Electronic Engineering
印刷版ISSN：2328-7365
电子版ISSN：2328-7357
出版年度：2013
卷号：1
期号：3
页码：60-63
DOI：10.12691/ajeee-1-3-5
语种：English
出版社：Science and Education Publishing
摘要： In this paper, Barlase has been taken a step further by emulating the degradation processes in high power semiconductor laser bars using an upgraded version of Barlase by the introduction of a global thermal solver to further deepen the understanding of the behaviour of laser bars. In this paper, the emulation of a real laser bar was investigated to emulate experimental results by simulating the experimental results in the view of finding a correlation between them. The results established show a more elaborate frown shaped power/current profile and a corresponding frown shaped temperature profile especially at the front facet of the laser bar. Even though a more elaborate frown shaped profile was realised in the power, current and temperature profiles, it fell short from what was seen in the experimental results. As the emulation of laser bar degradation has not been attempted before, further work is needed to achieve better agreement in the output power, current and temperature profiles to better the model.
关键词：by-emitter; emitter; calibration; tapered laser bar; power; Heatsink temperature; electroluminescence; near infra-red; degradation; trap density
