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  • 标题:PCB Defect Detection Using Image Processing
  • 本地全文:下载
  • 作者:Abhishek V ; Shithil K ; Srastith Shetty
  • 期刊名称:International Journal of Advances in Engineering and Management
  • 电子版ISSN:2395-5252
  • 出版年度:2021
  • 卷号:3
  • 期号:7
  • 页码:3029-3031
  • DOI:10.35629/5252-030728392844
  • 语种:English
  • 出版社:IJAEM JOURNAL
  • 摘要:Printed Circuit Boards are by far the most common method of assembling modern electronic circuits. During the manufacturing of PCB many defects are introduced which are harmful to precision circuit performance. The importance of the Printed Circuit Board inspection process has been magnified by requirements of the modern manufacturing environments where delivery of 100% defect free PCBs is the expectation. To meet such expectations, identifying various defect and their types becomes the first step.Human inspection is not productive and may introduce subjective aspects. Hence, Automated Inspection becomes critical in order to assure desired performance. Introducing and implementing a PCB inspection system using image processing to remove the subjective aspects of manual inspection. The basic technique of the proposed system is to detect the defect based on the digital image of the PCB using image processing techniques.Typical defects that can be detected are over etchings (opens), under-etchings (shorts), holes, missing components etc.
  • 关键词:PCB;Image Processing;Automated Inspection
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