摘要：AbstractThermally evaporated CdS: Cl films were subjected to gamma irradiation with an equivalent dose intensity of 4.11 kG/hour for extended periods (60 to 240) minutes. The resultant films were examined by different approaches to acquire structural, morphological and optical information. Upon gamma irradiation doses, the samples show variation in grain size, dislocation density, microstrain and texture coefficient. The XRD patterns exhibit the hexagonal crystal structure formation of CdS: Cl. FESEM images disclosed an extensive spherical nature of nanocrystallites. They demonstrated an increase in their size, while optical study reveals a decrease in bandgap (Eg) and an increase in Urbach energy (EU) due to gamma doses. Electrical studies display a reduction in resistivity upon irradiation doses of gamma. These tailored films can find application as window layers in optoelectronic devices.
