出版社：The Society of Photographic Science and Technolgy of Japan
摘要：An electron microscope Model JEM-2000 SCM equipped with a superconducting magnet lens, developed recently by JEOL, has been applied to the observation of AgBr microcrystal lattice images.Since the specimens are kept at liquid He temperature in this system, this apparatus facilitates observation of materials sensitive to radiation damage. High-resolution AgBr lattice images taken with this electron microscope are presented.
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