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  • 标题:ESRによるlr錯体ドーパントの電子放出過程の解析
  • 本地全文:下载
  • 作者:河戸 孝二 ; 小川 恭平 ; 佐藤 忠伸
  • 期刊名称:日本写真学会誌
  • 印刷版ISSN:0369-5662
  • 电子版ISSN:1884-5932
  • 出版年度:2005
  • 卷号:68
  • 期号:Suppliment2
  • 页码:69-70
  • DOI:10.11454/photogrst1964.68.Suppliment2_69
  • 出版社:The Society of Photographic Science and Technolgy of Japan
  • 摘要:

    Kinetics of electron-detrapping process of Ir dopants in AgCl emulsion grains was studied by photo-induced ESR measurement. We made the kinetic model to analyze the lifetime of electrons trapped by Ir dopants quantitatively. The ESR signal was attenuated in a double-exponential way. The fast decay indicated the electron-detrapping process of Ir dopants, and the slow decay corresponded to the “desensitizaton” in photographic process.

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