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  • 标题:FAULT REMOVAL EFFICIENCY IN SOFTWARE RELIABILITY GROWTH MODEL
  • 本地全文:下载
  • 作者:PURNAIAH B., RAMA KRISHNA V., BALA VENKATA KISHORE G.
  • 期刊名称:Advances in Computational Research
  • 印刷版ISSN:0975-3273
  • 电子版ISSN:0975-9085
  • 出版年度:2012
  • 期号:492
  • 页码:74-77
  • 出版社:Bioinfo Publications
  • 摘要:Software Reliability is defined as the probability of free-failure operation for a specified period of time in a specified environment. Software Reliability Growth models (SRGM) have been developed to estimate software reliability measures such as number of remaining faults, software failure rate and Software Reliability. Imperfect debugging models are considered in these models. However, most SRGM assume that faults will eventually be removed. Fault removal efficiency in the existing models is limited. This paper aims to incorporate the fault removal efficiency in software reliability growth modeling. In this paper imperfect debugging is considered in the sense that new faults can be introduced into the software during debugging and the detected faults may not be removed completely.
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