期刊名称：International Journal of Computer Trends and Technology
电子版ISSN：2231-2803
出版年度：2011
卷号：2
期号：2-2
出版社：Seventh Sense Research Group
摘要：Rapid increase in population increased the usage of digital components dramatically and their production. For profitable income, the cost of the finished product and time taken for marketing the product needs to be reduced. In this paper, the authors conducted extensive survey of methods developed earlier to detect faults and minimize test set in digital circuits. The survey is limited to methods for simple combinational circuits only. In effect, this paper compares 11 different fault detection and test minimization methods for simple circuits. In addition, a survey on evolutionary techniques for optimizing the test set in digital circuits is performed. The surveyed methods are widely accepted by industries manufacturing digital circuits. A very brief introduction to entire flow of test minimization process is also presented.
关键词：Combinational Circuits; Fault Detection; Genetic Algorithm; ILP; Stuck-at-faults; Test Minimization
