期刊名称：International Journal of Computer Trends and Technology
电子版ISSN：2231-2803
出版年度：2013
卷号：4
期号：5-2
出版社：Seventh Sense Research Group
摘要：As the size and complexity of systemsonchips continues to grow, the power dissipation during testing becomes very significant problem. During scan shifting, more transitions occur in the flipflops compared to what occurs during normal functional operation. The proposed encoding scheme can be used in conjunction with partial LFSR reseeding scheme to significantly reduce test power and test storage. Encoding scheme act as the second stage of compression after LFSR reseeding. The number of transition in the scan chain can be reduced by filling the number of unspecified bits in different manner. And also it reduces the number of specified bits through LFSR reseeding to provide better encoding efficiency. This method can prevent all transitions in the nontransitional blocks and can reduce the number of specified bits for the nontransitional blocks.
关键词：Test data compression; Linear Feedback Shift Register (LFSR); Reseeding; Test power
