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  • 标题:Analysis of Failure in Miniature X-ray Tubes with Gated Carbon Nanotube Field Emitters
  • 本地全文:下载
  • 作者:Kang, Jun-Tae ; Kim, Jae-Woo ; Jeong, Jin-Woo
  • 期刊名称:ETRI Journal
  • 印刷版ISSN:1225-6463
  • 电子版ISSN:2233-7326
  • 出版年度:2013
  • 卷号:35
  • 期号:6
  • 页码:1164-1167
  • DOI:10.4218/etrij.13.0213.0346
  • 语种:English
  • 出版社:Electronics and Telecommunications Research Institute
  • 摘要:We correlate the failure in miniature X-ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X-ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X-ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X-ray tubes.
  • 关键词:Carbon nanotube;field emission;triode;miniature X-ray tube;charging
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