出版社：Electronics and Telecommunications Research Institute
摘要：From a practical viewpoint, the topic of electrical stability in oxide thin-film transistors (TFTs) has attracted strong interest from researchers. Positive bias stress and constant current stress tests on indium-gallium-zinc-oxide (IGZO)-TFTs have revealed that an IGZO-TFT with a larger Ga portion has stronger stability, which is closely related with the strong binding of O atoms, as determined from an X-ray photoelectron spectroscopy analysis.
关键词：In-Ga-Zn oxide;IGZO;electrical stability;thin-film transistor;XPS;oxygen binding energy
