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  • 标题:NoC-Based SoC Test Scheduling Using Ant Colony Optimization
  • 本地全文:下载
  • 作者:Ahn, Jin-Ho ; Kang, Sung-Ho
  • 期刊名称:ETRI Journal
  • 印刷版ISSN:1225-6463
  • 电子版ISSN:2233-7326
  • 出版年度:2008
  • 卷号:30
  • 期号:1
  • 页码:129-140
  • 语种:English
  • 出版社:Electronics and Telecommunications Research Institute
  • 摘要:In this paper, we propose a novel ant colony optimization (ACO)-based test scheduling method for testing network-on-chip (NoC)-based systems-on-chip (SoCs), on the assumption that the test platform, including specific methods and configurations such as test packet routing, generation, and absorption, is installed. The ACO metaheuristic model, inspired by the ant's foraging behavior, can autonomously find better results by exploring more solution space. The proposed method efficiently combines the rectangle packing method with ACO and improves the scheduling results by dynamically choosing the test-access-mechanism widths for cores and changing the testing orders. The power dissipation and variable test clock mode are also considered. Experimental results using ITC'02 benchmark circuits show that the proposed algorithm can efficiently reduce overall test time. Moreover, the computation time of the algorithm is less than a few seconds in most cases.
  • 关键词:NoC-based SoC test scheduling;rectangle packing;ant colony optimization
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