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  • 标题:Markov 과정을 이용한 디지탈 교환기의 신뢰도 모형
  • 本地全文:下载
  • 作者:Sin, Seong-Mun ; Choe, Tae-Gu ; Lee, Dae-Gi
  • 期刊名称:ETRI Journal
  • 印刷版ISSN:1225-6463
  • 电子版ISSN:2233-7326
  • 出版年度:1983
  • 卷号:5
  • 期号:2
  • 页码:3-8
  • 语种:Korean
  • 出版社:Electronics and Telecommunications Research Institute
  • 摘要:This paper derives the Markov model to calculate the reliability of the Digital Switching System being developed by KETRI. Using the failure states extracted from the system in the course of the modelling, we calculated the reliability of both the service grade and the function of the system. Especially, by including the repair rate into the model, we took optimum advantage of theMarkov process and solved the difficulties in the calculation by reducing the number of states of the system.
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