期刊名称：International Journal of Computer Science and Information Technologies
电子版ISSN：0975-9646
出版年度：2014
卷号：5
期号：4
页码：5047-5052
出版社：TechScience Publications
摘要：Line-of-sight graph is used to check the number of short circuit testing needed to test a printed circuit board. This paper presents a simple algorithm based on some assumptions to put color in a circuit dual hypergraph of a VLSI circuit. The structures of line-of-sight graphs with 10, 11, 12 and 13 colors have been established. This algorithm can be used to find out number of short circuit testing needed for a VLSI printed circuit board.
关键词：Line-of-sight graph; short circuit testing;VLSI circuit; circuit dual hypergraph
