期刊名称：International Journal of Hybrid Information Technology
印刷版ISSN：1738-9968
出版年度：2014
卷号：7
期号：5
页码：191-200
DOI：10.14257/ijhit.2014.7.5.18
出版社：SERSC
摘要：The application of Static Random-Access Memory (SRAM), becomes more and more widely in aviation. However, the large amount of SRAM cells is very vulnerable to radiation included single-event upset (SEU). Based on the detection requirement of SRAM's SEU, the detected circuit of the SEU on SRAM is designed. Then the method of redundancy check is used in the reinforcement of the SEU. The test results shows that the detection circuit can detect the SRAM-type storage chip sensitive bit of the single particle and the proposed method can improved the performance of anti-single particles of SRAM several times as high as 1E6.
