期刊名称：International Journal of Security and Its Applications
印刷版ISSN：1738-9976
出版年度：2015
卷号：9
期号：10
页码：187-200
DOI：10.14257/ijsia.2015.9.10.17
出版社：SERSC
摘要：The optimal test sequence design for fault diagnosis is a challenge NP-complete problem. An improved Differential Evolution algorithm with additional inertial weighting item (inertial velocity) is proposed to solve the Optimal Test sequence Problem (OTP) in complicated electronic system. The proposed algorithm called Inertial Velocity Differential Evolution (IVDE) is constructed based on an adaptive differential evolution algorithm. IVDE combined with a new individual fitness function optimizes the test sequence sets with the index of fault isolation rate satisfied in top-down to generate diagnostic decision tree to decrease the test cost and the number of tests used. The simulation results show that IVDE algorithm can cut down the test cost under the satisfied fault isolation rate requirement. Compared with the other algorithm such as PSO (particle swarm optimizer)and GA(genetic algorithm), IVDE can get better solution of the OTP.
