期刊名称：International Journal of Computer Science and Network
印刷版ISSN：2277-5420
出版年度：2013
卷号：2
期号：1
出版社：IJCSN publisher
摘要：The Very Large Scale Integration(VLSI) has a dramatic impacton the growth of digital technology. VLSI has not only reducedthe size and cost, but also increased the complexity of thecircuits. Due to increase in complexity, it is difficult to testcircuits. To reduce this problem of testing, it is advantageous toadd another IC along with it which will test and correct errorsby itself. This IC is known as Built in Self Test(BIST).In thispaper , we are particularly concentrating upon finding thecomparative parameters of Euclid’s and Stein’s Algorithm ,which is used to find greatest common divisor(GCD) of two nonnegative integers. Thus, the best parameters to be found can beused effectively for finding gcd , This indirectly reduces time forcalculating greatest common divisor , which is being used veryfrequently in communication applications.
