期刊名称：International Journal of Engineering and Computer Science
印刷版ISSN：2319-7242
出版年度：2015
卷号：4
期号：12
页码：15328-15333
出版社：IJECS
摘要：Nanoscale technology promises dramatic increases in device density, but reliability is decreased as a side-effect. With bit-error ratesprojected to be as high as 10%, designing a usable nanoscale memory system poses a significant challenge. Storing defect informationcorresponding to every bit in the nanoscale device using a reliable storage bit is prohibitively costly. Using a Bloom filter to store a defectmap provides better compression at the cost of a small false positive rate (us-able memory mapped as defective). Using a list-based techniquefor storing defect maps performs well for cor-related errors, but poorly for randomly distributed de-fects. In this paper, we propose analgorithm for parti-tioning correlated defects from random ones. The mo-tivation is to store the correlated defects using rectan-gular rangesin a ternary content-addressable memory (TCAM) and random defects using a Bloom filter. We believe that a combination of Bloom filterand small size TCAM is more effective for storing defect map at high error rate. We show the results for different correlated distributions
