期刊名称：International Journal of Innovative Research in Computer and Communication Engineering
印刷版ISSN：2320-9798
电子版ISSN：2320-9801
出版年度：2014
卷号：2
期号：6
出版社：S&S Publications
摘要：This paper presents a new and comprehensive power-aware test scheme compatible with a testcompression environment. The key contribution of the paper is a flexible test application framework that achievessignificant reductions in switching activity during all phases of scan test: scan loading, unloading, and capture.
