期刊名称：International Journal of Innovative Research in Computer and Communication Engineering
印刷版ISSN：2320-9798
电子版ISSN：2320-9801
出版年度：2015
卷号：3
期号：9
DOI：10.15680/IJIRCCE.2015. 0309063
出版社：S&S Publications
摘要：Identification and dimensional measurement of electronic components are important issues to beconsidered. A lot of research is going on to increase the liberty in dimensional measurements of the electroniccomponents. It is an efficient method which works on previously acquired images. Electronic components such as ICchips, chip resistors, chip capacitors, chip LEDs etc., are identified by edge detection, colour pattern matching andgauging is used for dimensional measurement of the components. In this paper we have compared different templatebased and optimal edge detection methods. Various edge detection techniques are evaluated to inspect basic dimensionsof Surface mount Chip resistor using machine vision. This paper represents the steps and approach to inspect basicnotch dimension of chip resistor by using different edge detection techniques which would be helpful for qualityinspection within précised time. Roberts, Sobel and Prewitt are used as template based edge detectors and Marr-Hilderth (LoG) Edge detector, Canny Edge detector and Infinite Symmetrical Exponential Filters (ISEF) are used asoptimal edge detectors to find the notch termination dimension with discrepancies of SMD resistor. The results of bothoptimal edge detection algorithm and template based edge detection algorithms were found similar in this case.
关键词：Machine vision; Template based edge detection methods; ISEF; Optimal edge detection method;Surface Mount Chip resistor; Notch termination
