期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2015
卷号：4
期号：2
页码：670
DOI：10.15680/IJIRSET.2015.0402086
出版社：S&S Publications
摘要：Polycrystalline Cu2ZnSnS4 (CZTS) thin film has been grown on glass substrate by RF-magnetronsputtering at substrate temperature 573 K using a commercial target of same composition. Structural and opticalproperties of the grown thin film have been investigated by X-ray diffraction (XRD), scanning electron microscope(SEM), Raman spectroscopy and UV-vis spectroscopy. Detailed analysis of XRD data has showed that the as-grownCZTS thin film has keserite structure ( I 4 , a = 5.4290 and c = 10.849Å) with preferred orientation along (112) plane.All the peaks observed in the XRD pattern have been accounted for kieserite structure, which shows the absence ofadditional phases such as elemental or binary or ternary systems in the grown film. SEM images recorded withdifferent magnification have showed that the film has smooth and homogeneous surface with average crystallite size100 nm. Raman spectrum recorded at room temperature has showed the dominant Raman shift at about 326 cm-1 whichcan be attributed to A1 mode and confirms the formation of kieserite CZTS phase. From optical transmittance spectrum,the grown film is found to have direct band gap of ~1.51 eV. The above observations show that the material underinvestigation is suitable for solar cell application.
关键词：Cu2ZnSnS4; RF magnetron sputtering; XRD; SEM; Raman spectroscopy and Optical band gap.
