期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2015
卷号：4
期号：7
页码：5476
DOI：10.15680/IJIRSET.2015.0407087
出版社：S&S Publications
摘要：Fabric defect detection plays an important role in maintaining the quality of fabric in textile industry.There are many methods available for detecting defects in patternless fabrics. Defect detection in patterned fabrics is atedious task. In this paper a new method is proposed for the detection of defects in patterned fabrics. Also classificationof fabric patterns is done with a technique combining Radon Signature and DWT which is assisted by multiclass svm.This proposed method helps to recognize fabric patterns and fabric defects with minimum cost and time which is veryuseful in largescale textile production units. This method can be used for fabrics having patterns like Plaid, Striped,Irregular as well as patternless. Comparison of features and defect detection is done using Speeded Up RobustFeatures(SURF) which gives faster and better results.
