期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2016
卷号：5
期号：2
页码：1952
DOI：10.15680/IJIRSET.2015.0502141
出版社：S&S Publications
摘要：Accuracy and precision are most important parameters regarding quality inspection of physicaldimensions of any electronics object or component or any device in an Electronic Industry. It directly affects many oralmost all electronic circuit performances, and also it plays a vital role. In this paper we have tried to measure themechanical or physical dimensions of chip resistor with the combination of optimal edge detection method and robustestimation method to achieve high precision with accuracy. Different optimal edge detection algorithms such as Marr-Hilderth algorithm LoG, Canny algorithm and Shen Castan algorithm with location M estimator (Robust M estimation)are used to inspect mechanical dimensions (notch) of chip resistors.
