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  • 标题:Residual Defect Prediction using Multiple Technologies
  • 本地全文:下载
  • 作者:WanJiang Han ; LiXin Jiang ; TianBo Lu
  • 期刊名称:International Journal of Multimedia and Ubiquitous Engineering
  • 印刷版ISSN:1975-0080
  • 出版年度:2015
  • 卷号:10
  • 期号:8
  • 页码:1-12
  • DOI:10.14257/ijmue.2015.10.8.01
  • 出版社:SERSC
  • 摘要:Finding defects in a software system is not easy. Effective detection of software defects is an important activity of software development process. In this paper, we propose an approach to predict residual defects, which applies machine learning algorithms (classifiers) and defect distribution model. This approach includes two steps. Firstly, use machine learning Algorithms and Association Rules to get defect classification table, then confirm the defect distribution trend referring to several distribution models. Experiment results on a GUI project show that the approach can effectively improve the accuracy of defect prediction and be used for test planning and implementation.
  • 关键词:residual defect prediction; defect distribution model; software defect ; classification; defect trend; classifiers
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