期刊名称：International Journal of Computer and Information Technology
印刷版ISSN：2279-0764
出版年度：2014
卷号：3
期号：6
出版社：International Journal of Computer and Information Technology
摘要：As integrated circuit technology scales into the deep- submicron regime, radiation-induced soft errors threat the reliability of on-chip memory applications. Neutron-induced soft errors cause Multiple Cell Upsets (MCUs) in physically adjacent regions and may lead to system failures. Recently Single Error Correction, Double Error Detection, and Double Adjacent Error Correction (SEC–DED–DAEC) codes are presented to correct these errors. However, these conventional codes do not resolve mis-correction of double non-adjacent errors because the syndromes for double non-adjacent errors are equal to those for double adjacent errors. In this paper, we propose SEC–DED– DAEC codes that have no mis-correction. To obviate the mis- correction, the column vectors in a H -matrix are selected from a column pool matrices with reversed colexicographic order and are alternately placed according to column weight. Experimental results show that the mis-correction rate for our proposed codes is zero and the hardware overhead of the decoder and parity check bits is small. The proposed codes are suitable for protecting on-chip memory applications from MCUs.
