期刊名称：Journal of Software Engineering and Applications
印刷版ISSN：1945-3116
电子版ISSN：1945-3124
出版年度：2016
卷号：09
期号：03
页码：91-101
DOI：10.4236/jsea.2016.93008
语种：English
出版社：Scientific Research Publishing
摘要：Side channel attack may result in user key leakage as scan test techniques are applied for crypto-graphic chips. Many secure scan designs have been proposed to protect the user key. This paper meticulously selects three current scan test techniques, analyses their advantages and disadvantages and also compares them in security and area overhead. Users can choose one of them according to the requirements and further combination can be implemented to achieve better performance.
关键词：Side Channel Attack;Scan Test Techniques;Secure Scan Designs
