期刊名称：ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences
印刷版ISSN：2194-9042
电子版ISSN：2194-9050
出版年度：2002
卷号：XXXIV Part 3 A
页码：375-380
出版社：Copernicus Publications
摘要：Offsets between overlapping strips of laser altimetry data serve as the input for strip adjustment procedures that estimate and eliminate systematic errors in laser altimetry datasets. For a three-dimensional strip adjustment offsets are to be measured in three dimensions. Height offsets can be determined straightforward by comparing the heights of horizontal planes. Planimetric offsets are more difficult to determine. This paper shows that the usage of standard least squares matching algorithms on height data as well as on reflectance data may lead to significant biases in the estimation of planimetric offsets. For height data, a model based estimation of linear features is proposed since the number of locations in strip overlaps that are suitable for the estimation of offsets in three dimensions may not be sufficient to estimate all error parameters of a strip adjustment. To improve both the offset estimation and the offset variance estimation using reflectance data an edge response function is introduced. This function takes into account the difference in size of a laser beam's footprint and the distance between successive laser points
关键词：Laser altimetry; strip adjustment; error estimation; least squares matching
