期刊名称：ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences
印刷版ISSN：2194-9042
电子版ISSN：2194-9050
出版年度：1980
卷号：XXIII Part B5
页码：244-251
出版社：Copernicus Publications
摘要：Mapping potentials with micrographs from Scanning Electron Microscopes(SEMs) and Transmission Electron Microscopes (TEMs) are considered . Fundamentalprojection geometry and associated distortions related mathematicalmodels are presented. Available hardware and methods of mapping in view ofthe problems related to the provision of controls are discussed . Accuracyand reliability considerations as well as the associated ideas on stabilityand repeatability at such microscope systems are presented . All theseindicate great possibilities in the increased use of electron microscopesin various mapping problems, representative cases of which from severalfields of science and engineering are discussed .
