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文章基本信息

  • 标题:Truncated Life Test Sampling Plan under Log-Logistic Model
  • 本地全文:下载
  • 作者:M.Gomathi ; Dr. S. Muthulakshmi
  • 期刊名称:International Journal of Innovative Research in Science, Engineering and Technology
  • 印刷版ISSN:2347-6710
  • 电子版ISSN:2319-8753
  • 出版年度:2014
  • 卷号:3
  • 期号:7
  • 页码:14397
  • 出版社:S&S Publications
  • 摘要:Skip Lot acceptance sampling plan is proposed for the truncated life test based on product qualityfollowing log-logistic distribution. For the proposed plan the minimum sample size necessary to ensure the specifiedmedian life are obtained at the given consumer’s confidence level. The operating characteristic values are analyzedwith various ratios of the true median lifetime to the specified lifetime of the product. The minimum ratios of the truepopulation median life to the specified median life are also obtained at the specified producer’s risk. Selection andapplication of sampling plan is illustrated with a numerical example.
  • 关键词:Skip-Lot acceptance sampling plan; consumer’s confidence level; producer’s risk; operating;characteristic function; binomial model
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