期刊名称：International Journal of Advanced Research in Computer Engineering & Technology (IJARCET)
印刷版ISSN：2278-1323
出版年度：2012
卷号：1
期号：7
页码：125-129
出版社：Shri Pannalal Research Institute of Technolgy
摘要：Peak power corresponds to the highest value of instantaneous power measured during testing. The peak power generally determines the thermal and electrical limits of the circuit and the system packaging requirements. High peak power in only one clock cycle can be an issue if it results in a significant ground bounce or an IR-drop phenomenon that causes a memory element to lose its state and the test procedure to unnecessarily fail. Tools for evaluating the worst-case peak-power consumption of sequential circuits are strongly required by designers of low-power circuits. Previously proposed methods search for the initial state and the couple of vectors with maximum consumption, without exploiting the information on the reachable state set during the power estimation process. This paper shows that this can lead to significant underestimation of the maximum power consumption, and proposes an algorithm for overcoming this drawback.
