首页    期刊浏览 2024年11月23日 星期六
登录注册

文章基本信息

  • 标题:An Effectual Estimation of Software Defect (EESD)
  • 本地全文:下载
  • 作者:Raghvendra Omprakash Singh ; Yuvraj B. Hembade ; Pradeep Kumar Sharma
  • 期刊名称:International Journal of Advanced Research in Computer Engineering & Technology (IJARCET)
  • 印刷版ISSN:2278-1323
  • 出版年度:2014
  • 卷号:3
  • 期号:4
  • 页码:1122-1126
  • 出版社:Shri Pannalal Research Institute of Technolgy
  • 摘要:An correct prediction of range of defects during a product throughout system testing contributes not solely to the management of the system testing method however additionally to the estimation of product's maintenance. Here, a replacement approach, referred to as 'Functional Estimation package Defect is conferred that computes associate degree estimate of total range of defects in associate degree in progress testing method. The estimation of the whole range of defects at early stages of the testing method helps managers to create resourceallocation and point in time selections. the employment of nonbayesian approaches has well-tried to be correct however presents a definite latency to realize an inexpensive accuracy. Here we have a tendency to describe useful Estimation package Defect model
  • 关键词:Estimation Model; Defect Estimation; ; Estimator; Approximator
国家哲学社会科学文献中心版权所有