期刊名称：International Journal of Advanced Research in Computer Engineering & Technology (IJARCET)
印刷版ISSN：2278-1323
出版年度：2015
卷号：4
期号：3
页码：809-814
出版社：Shri Pannalal Research Institute of Technolgy
摘要：Testing of Embedded System is a great challenge for software testers. Testing of embedded systems is most sophisticated and time consuming task because of its different infrastructure, organizations and techniques used for its development. Testing of application specific Embedded System is not similar to testing of another Embedded System. This paper gives a new artificial intelligent approach for testing of various Embedded Systems. It focuses on three different aspects. First is the efficient use of an Artificial Intelligence approach to test the Embedded System. Second is the development of one universal platform for testing. Third is development of safety critical character generator device. Safety critical characteristics are being monitored, tested and analyzed with an Artificial Intelligence Approach. An Artificial Intelligence approach uses Artificial Neural Network to train the neural network. Multiple embedded systems are successfully tested together in real time environment using the above approach.
关键词：Artificial Intelligent Approach; Black Box ; Testing; Embedded System Testing; Safety Critical Character ; Generator
