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文章基本信息

  • 标题:Cost Benefit Analysis of Three Unit Redundant System Model with Correlated Failures and Repairs
  • 本地全文:下载
  • 作者:V. K. Sharma ; Surendra Prabhat Gupta
  • 期刊名称:Journal of Pure and Applied Science and Technology
  • 印刷版ISSN:2231-4202
  • 电子版ISSN:2249-9970
  • 出版年度:2012
  • 卷号:2
  • 期号:1
  • 页码:1-10
  • 出版社:Natthan Lal Sevarth Samiti
  • 摘要:

    In this paper, an attempt is made to study an analysis of three unit redundant system model with correlated failures and repair times. In this work analysis of reliability and mean time to system failure, availability analysis, busy period analysis and profit function analysis are studied. Also graphical study of the system model is shown. The result indicated that higher correlation between the failure and repair times provides the better system performance.

  • 关键词:Mean Time to System Failure (MTSF); Steady State Availability; Busy Period; Modified;Bessel’s Function; Bivariate Exponential; Laplace Transform and L-Hospital’s Rule.
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