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  • 标题:Development of Testing Environment for Embedded Systems
  • 本地全文:下载
  • 作者:Ashwini M. Motghare ; Swapnili P. Karmore
  • 期刊名称:International Journal of Advanced Research in Computer Engineering & Technology (IJARCET)
  • 印刷版ISSN:2278-1323
  • 出版年度:2012
  • 卷号:1
  • 期号:3
  • 页码:263-266
  • 出版社:Shri Pannalal Research Institute of Technolgy
  • 摘要:Quality is the life of embedded systems, and the testing is a basic guarantee for stable and reliable operation of the embedded systems. Testing is an important part in the development of any system as it represents the ultimate verification and validation of specification, design and code. The goal of testing is to design a series of test cases that has the highest likelihood of finding most of the errors with a minimum amount of time and effort. The techniques used to test the embedded systems provide systematic guidance for designing tests that exercise the internal logic of Embedded System components and test the input and output domains of the program to uncover errors in program function, behavior and performance. Simulation can be used as an alternative to the actual target system for a significant portion of the testing effort, saving developers time and money, as well as increasing test coverage and providing better debugging facilities, it becomes much more necessary to construct embedded systems testing environment.
  • 关键词:Embedded Systems; Simulation Testing ; Environment; Embedded system testing environment (ESTE)
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